Local Structure Determination in Strain-Engineered Electronic Thin Films

Note: Pizza served at 11:45 AM
Speaker: Dr. Joe Woicik, NIST

When: February 11, 2011 (Fri), 12:00PM to 01:00PM (add to my calendar)
Location: SCI 352
Hosted by: Karl Ludwig

This event is part of the Biophysics/Condensed Matter Seminar Series.

Abstract:
X-ray absorption fine structure is combined with x-ray diffraction to study the local atomic structure of strain engineered electronic thin films. Examples will include the local atomic structure of strained-layer semiconductor alloys and ferroelectric SrTiO3 layers on Si. Detailed comparisons will be made with theory.