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VERSION:2.0
PRODID:-//RLASKEY//CALENDEROUS//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
BEGIN:VEVENT
DTSTAMP:20260918T221833Z
LAST-MODIFIED:20121116T203436Z
DTSTART:20110211T170000Z
DTEND:20110211T180000Z
UID:event740@bu.edu
URL:http://physics.bu.edu/internal/events/show/740
SUMMARY:Local Structure Determination in Strain-Engineered Electronic Thin 
	Films
DESCRIPTION:Featuring Dr. Joe Woicik\, NIST\nHosted by: Karl Ludwig\n\nPart
	 of the Biophysics/Condensed Matter Seminar Series.\n\nAbstract:\nX-ray abs
	orption fine structure is combined with x-ray diffraction to study the loca
	l atomic structure of strain engineered electronic thin films. Examples wil
	l include the local atomic structure of strained-layer semiconductor alloys
	 and ferroelectric SrTiO3 layers on Si.  Detailed comparisons will be made 
	with theory.
LOCATION:SCI 352\, 590 Commonwealth Avenue\, 02215
STATUS:CONFIRMED
CLASS:PUBLIC
END:VEVENT
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