Physics (Internal)

High Numerical Aperture Microscopy with Non-Gaussian Beams

This event is part of the Preliminary Oral Exam.

Examining Committee: Committee: Bennett Goldberg, Thomas Bifano, Claudio Chamon, and Michael El-Batanouny

Abstract:

Improved resolution is needed in high numerical aperture microscopy to meet the demands of biological and semiconductor imaging. Non-Gaussian beams have unusual properties, such as significant longitudinal electric fields, when focused in high NA systems that can be exploited to improve microscopy metrics. This talk will focus on non-Gaussian beams, how they function in high NA systems, and how they can be used to improve microscopy metrics such as resolution.