ARTICLES (since 1995)

"An off-normal fiber-like texture in thin films on single crystalline substrates", C. Detavernier, A.S. Özcan, J. Jordan-Sweet, E.A. Stach, J. Tersoff, F.M. Ross and C. Lavoie, Nature, 426, 641 (2003).

"Ordering Kinetics in the Long-Period Superlattice Alloy Cu0.79Pd0.21", X. Wang, J. Mainville, K. Ludwig, X. Flament, R. Caudron and A. Finel, in preparation.

"Axiotaxy of CoSi2 thin films on Si(100)", A.S. Özcan, C. Detavernier, C. Lavoie, K.F. Ludwig, Jr. and J. Jordan-Sweet, submitted to JAP.

"A new type of texture in thin films: Axiotaxy for tetragonal -FeSi2 films on Si(100)", C. Detavernier, A.S. Özcan, C. Lavoie and J. Jordan-Sweet, submitted to Phys. Rev B.

"Evolution of Microstructure in Ti-Ta Bilayer Thin Films on poly-Si and Si(001)", A.S. Özcan, K. F. Ludwig, Jr., C. Lavoie, C. Coia, S.N. Basu, C. Cabral, Jr., K. P. Rodbell and J.M.E. Harper, submitted to Thin Solid Films.

"Complex Ordering in Ternary Wurtzite Nitride Alloys", L. Iliopoulos, K.F. Ludwig, Jr. and T.D. Moustakas, submitted to Journal of Physics and Chemistry of Solids.

"Time-resolved Small Angle X-ray Scattering Study of the Kinetics of Disorder-Order Transition in a Triblock Copolymer in a Selective Solvent for the Middle Block", H. Nie, R. Bansil, K. Ludwig, M. Steinhart, C. Konak and J. Bang, submitted to Macromolecules.

"Structure and Ordering Kinetics of Micelles in Triblock Copolymer Solutions in Selective Solvents", R. Bansil, H. Nie, Y. Li, G. Liao, K. Ludwig, M. Steinhart, C. Konak and J. Lal, Macromol. Symp. 190, 161 (2002).

"Texture Formation in Ti-Ta Alloy Disilicide Thin Films", A.S. Özcan, K.F. Ludwig, C. Lavoie, C. Cabral, Jr. and J.M.E. Harper, J. Appl. Phys. 92, 7210 (2002).

"Time-resolved X-ray Diffraction Studies of the Texture Formation Kinetics in the C49-C54 TiSi2 Phase Transformation", A.S. Özcan, K.F. Ludwig, Jr., C. Lavoie, C. Cabral, Jr. and J.M.E. Harper, Advances in X-ray Analysis 46, in press (2002).

"Nucleation and Growth Kinetics of Preferred C54 TiSi2 Orientations: Time-Resolved X-Ray Diffraction Measurements", A. S. Özcan, K. F. Ludwig, Jr., C. Lavoie, C. Cabral, Jr., J.M.E. Harper and R. M. Bradley, J. Appl. Phys. 92, 5189 (2002).

"Si(100) Surface Morphology Evolution during Normal Incidence Sputtering with 100-500 eV Ar+ Ions", K.F. Ludwig, Jr., C.R. Eddy, Jr., O. Malis and R.L. Headrick, Appl. Phys. Lett. 81, 2770 (2002).

"Texture of TiSi2 Thin Films on Si(001)", A.S. Özcan, K.F. Ludwig, P. Rebbi, C. Cabral, Jr., C. Lavoie and J.M.E. Harper, J. Appl. Phys. 92, 5011 (2002).

A.S. Özcan, K.F. Ludwig, Jr., K.P. Rodbell, C. Lavoie, C. Cabral, Jr., J.M.E. Harper, J. Jordan-Sweet, "Microstructure Evolution in Ti-Ta Bilayer Films on Si(001) and Poly-Si Studied by Time-Resolved X-ray Diffraction, Light Scattering and Resistance Analysis", Science Highlights, National Synchrotron Light Source Activity Report 2001.

"Epitaxial Growth and Self-Organized Superlattice Structures in AlGaN Films Grown by Plasma Assisted Molecular Beam Epitaxy", E. Iliopoulos, K.F. Ludwig, Jr., T.D. Moustakas, Ph. Komninou, Th. Karakostas, G. Nouet and S.N.G. Chu, Mat. Sci. and Eng. B 87, 227 (2001).

"Temperature Dependence of the Diffuse-Scattering Fine Structure in Cu-Pd Alloys", X. Wang, K. F. Ludwig, Jr., O. Malis, J. Mainville, X. Flament and R. Caudron, Phys. Rev. B 63, 092201 (2001).

"Chemical Ordering in AlGaN Alloys Grown by Molecular Beam Epitaxy", E. Iliopoulos, K. F. Ludwig, Jr., T. D. Moustakas and S. N. G. Chu, Appl. Phys. Lett. 78, 463 (2001).

"Characterization of InGaN/GaN Multiple Quantum Wells Grown by Molecular Beam Epitaxy", J. Vac. Sci. & Tech. B, 18, 1457 (2000).

"Kinetics of Phase Transitions in Equiatomic CuAu", O. Malis and K. Ludwig, Phys. Rev. B 60, 14675 (1999).

"Small Angle X-ray Scattering Study of Kinetics of Spinodal Decomposition in N-isopropylacrylamide Gels", G. Liao, R. Bansil, K. Ludwig and C. Konak, Phys. Rev. E 60, 4473 (1999).

"Temperature Dependence of the Diffuse Scattering Fine Structure in Equiatomic CuAu", O. Malis, K. Ludwig, W. Schweika, G. Ice and C. Sparks, Phys. Rev. B 59, 11105 (1999).

"Monte-Carlo Study of Short-range order and Displacement Effects in Disordered CuAu", O. Malis, K. Ludwig and B. Chakraborty, Phil. Mag. 79, 869 (1999).

"An X-ray Scattering and Simulation Study of the Ordering Kinetics in CuAu", K. Elder, O. Malis, K. Ludwig, B. Chakraborty and N. Goldenfeld, Europhys. Lett. 43, 629 (1998).

"Phase Separation and Ordering in InGaN alloys grown by Molecular Beam Epitaxy", D. Doppalapudi, S. Basu, K. Ludwig and T. Moustakas, J. Appl. Phys. 84, 1389 (1998).

"X-ray Characterization of GaN/AlGaN Multiple Quantum Wells for Ultraviolet Laser Diodes", D. Korakakis, K.F. Ludwig, Jr., and T. Moustakas, Appl. Phys. Lett. 72, 1004 (1998).

"Phase Formation Sequences in the Silicon-Phosphorus System: Determination by In-situ Synchrotron and Conventional X-ray Diffraction Measurements and Predicted by a Theoretical Model", J.R.A. Carlsson, L. Clevenger, L. Madsen, L. Hultman, X.H. Li, J. Jordan-Sweet, C. Lavoie, R.A. Roy, C. Cabral, G. Morales, K. Ludwig, G.B. Stephenson and H.T.G. Hentzell, Phil. Mag. B 75, 363 (1997).

"Morphology of Early Stage Phase Ordering", N. Gross, W. Klein and K. Ludwig, Phys. Rev. E 56, 5160 (1997).

"Long Range Order in AlxGa1-xN Films Grown by Molecular Beam Epitaxy", D. Korakakis, K.F. Ludwig, Jr. and T.D. Moustakas, Appl. Phys. Lett. 71, 72 (1997).

"X-ray Scattering Study of Early Stage Spinodal Decomposition in Al0.62Zn0.38", J. Mainville, Y.S. Yang, K.R. Elder, M. Sutton, K.F. Ludwig Jr. and G.B. Stephenson, Phys. Rev. Lett. 78, 2787 (1997).

"Formation of a Crystalline Metal-Rich Silicide in Thin Film Titanium/Silicon Reactions", L. Clevenger, C. Cabral, R. Roy, C. Lavoie, J. Jordan-Sweet, S. Brauer, G. Morales, K. Ludwig and G.B. Stephenson, Thin Solid Films 289, 220 (1996).

"Small-angle X-ray Scattering Studies of Semidilute Polystyrene-Cyclohexane Solution", Y. Xie, K.F. Ludwig Jr., R. Bansil, P. Gallagher, X. Cao and G. Morales, Physica A 232, 94 (1996).

"Time-resolved Small Angle X-ray Scattering Studies of Spinodal Decomposition Kinetics in Polystyrene-dioctylphthalate Solutions", Y. Xie, K.F. Ludwig Jr., R. Bansil, P. Gallagher, C. Konak, and G. Morales, Macromolecules 29, 6150 (1996).

"A Comparison of C54-TiSi2 Formation in Blanket and Submicron CMOS Gate Structures Using In-Situ X-ray Diffraction During Rapid Thermal Annealing", L. Clevenger, R. Roy, C. Cabral, K. Saenger, S. Brauer, G. Morales, KF. Ludwig, Jr., G. Gifford, J. Bucchignano, J. Jordan-Sweet and G.B. Stephenson, J. Mat. Res. 10, 2355 (1995).

"In-Situ X-ray Diffraction Analysis of the C49-C54 Titanium Silicide Phase Transformation in Narrow Lines", R. Roy, L. Clevenger, C. Cabral, K. Saenger,
S. Brauer, J. Jordan-Sweet, J. Bucchignano, G.B. Stephenson, G. Morales and
K.F. Ludwig, Jr., Appl. Phys. Lett. 66, 1732 (1995).

 

 

 

CONFERENCE PAPERS (since 1995)

A.S. Özcan, K.F. Ludwig, Jr., C. Lavoie, C. Cabral Jr. and J.M.E. Harper, "Time-Resolved X-Ray Diffraction Studies of the Texture Formation Kinetics in the C49-C54 Phase Transformation", Advances in X-Ray Analysis, Denver X-Ray Conference Proceedings, Vol. 46.

A.S. Özcan, K.F. Ludwig, Jr., C. Lavoie, C. Cabral Jr. and J.M.E. Harper, "In situ Studies of Silicide Formation in Ti-Ta Bilayer Thin Films on Poly-Si", Mat. Res. Soc. Proc., Symposium J, Vol. 721, J2.4.1 (2002).

A.S. Özcan, K.F. Ludwig, Jr., C. Cabral, Jr., C. Lavoie, J.M.E. Harper, "Influence of Substrate Temperature During Sputter Deposition on the Subsequent Formation of Titanium Disilicide", Mat. Res. Soc. Proc., Symposium N, Vol. 745, N6.4.1.

C. Detavernier, A.S. Özcan, C. Lavoie, J. Jordan-Sweet, J.M.E. Harper, "Kinetics of agglomeration of NiSi and NiSi2 phase formation", Mat. Res. Soc. Proc., Symposium N, Vol. 745, N4.12.

A. Gungor, K. Barmak, C. Cabral, Jr., A.S. Özcan, J.M.E. Harper, "Dissociation of Dilute Cu (Co), Cu (Nb), and Cu (B) Alloy Thin Films: Resistivity, Grain Growth and Texture Evolution", Mat. Res. Soc. Proc. Vol. 672 (2001).

"Doping Studies of n- and p-type AlxGa1-xN Grown by ECR Assisted MBE", D. Korakakis, H.M. Ng, K. Ludwig and T.D. Moustakas, Mat. Res. Soc. Symp. Proc. 449, 233 (1997).

"In-Situ X-ray Diffraction Analysis of CoSi2 Phase Formation on Single and Polycrystalline Silicon as a Function of Linewidth and Dopant at Rapid Thermal Annealing Rates", C. Cabral, L. Clevenger, R. Roy, G.B. Stephenson, C. Lavoie, K. Saenger, J. Jordan-Sweet, R. Viswanathan, G. Morales and K. Ludwig, Conf. Proc. ULSI XI, 439 (Materials Research Society, 1996).

"In-Situ Analysis of the Formation of Thin TiSi2 (<50 nm) Contacts in Submicron CMOS Structures During Rapid Thermal Annealing", L. Clevenger, C. Cabral, R.A. Roy, C. Lavoie, R. Viswanathan, K.L. Saenger, J. Jordan-Sweet, G. Morales, K.F. Ludwig, Jr., and G.B. Stephenson, in Silicide Thin Films, Fabrication, Properties, and Applications, ed. R. Tung, K. Maex, P. Pellegrini and L. Allen, 257 (MRS, 1996).

"In-Situ X-ray Diffraction and Resistivity Analysis of CoSi2 Phase Formation With and Without a Ti Interlayer at Rapid Thermal Annealing Rates", C.Cabral, Jr., L.A. Clevenger, G.B. Stephenson, S. Brauer, G. Morales, and K.F. Ludwig, Jr., Mat. Res. Soc. Symp. Proc. 375, 253 (1995).