Probing and structures with X-ray
This event is part of the Graduate Student Council Events.
Part of the student seminar series. A recording will be posted here after the seminar.
In this talk I will discuss a recent work of ours, in which we propose the use of resonant inelastic x-ray scattering (RIXS) to identify and characterize distinct geometric signatures in band structures of nodal point semimetals. RIXS is a one photon in - one photon process which imparts both energy and momentum to the material, effectively causing particle hole excitations across the Fermi level. By connecting the features of the RIXS cross section to properties of the band structure, we can falsify models and obtain a fit for low energy theory parameters. This is of particular significance now, given the improved RIXS resolution and understanding of the RIXS spectrum, as shown in our work. Keeping in my mind the mostly student audience, I will briefly review band theory and x-ray scattering before presenting our results.